Measure the single advance width with a heuristic method
This fix is needed to use dual-width fonts, which have double-width glyphs (e.g. CJK unified ideographs). Signed-off-by: Ryusei Yamaguchi <mandel59@gmail.com> Signed-off-by: Christoph Lohmann <20h@r-36.net>
This commit is contained in:
parent
30440295bc
commit
034a5c8a09
|
@ -417,3 +417,11 @@ static uint selmasks[] = {
|
|||
[SEL_RECTANGULAR] = Mod1Mask,
|
||||
};
|
||||
|
||||
/*
|
||||
* Printable characters in ASCII, used to estimate the advance width
|
||||
* of single wide characters.
|
||||
*/
|
||||
static char ascii_printable[] =
|
||||
" !\"#$%&'()*+,-./0123456789:;<=>?"
|
||||
"@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\\]^_"
|
||||
"`abcdefghijklmnopqrstuvwxyz{|}~";
|
||||
|
|
8
st.c
8
st.c
|
@ -68,6 +68,7 @@ char *argv0;
|
|||
#define LEN(a) (sizeof(a) / sizeof(a)[0])
|
||||
#define DEFAULT(a, b) (a) = (a) ? (a) : (b)
|
||||
#define BETWEEN(x, a, b) ((a) <= (x) && (x) <= (b))
|
||||
#define DIVCEIL(n, d) (((n) + ((d) - 1)) / (d))
|
||||
#define ISCONTROLC0(c) (BETWEEN(c, 0, 0x1f) || (c) == '\177')
|
||||
#define ISCONTROLC1(c) (BETWEEN(c, 0x80, 0x9f))
|
||||
#define ISCONTROL(c) (ISCONTROLC0(c) || ISCONTROLC1(c))
|
||||
|
@ -3277,6 +3278,7 @@ xloadfont(Font *f, FcPattern *pattern)
|
|||
{
|
||||
FcPattern *match;
|
||||
FcResult result;
|
||||
XGlyphInfo extents;
|
||||
|
||||
match = FcFontMatch(NULL, pattern, &result);
|
||||
if (!match)
|
||||
|
@ -3287,6 +3289,10 @@ xloadfont(Font *f, FcPattern *pattern)
|
|||
return 1;
|
||||
}
|
||||
|
||||
XftTextExtentsUtf8(xw.dpy, f->match,
|
||||
(const FcChar8 *) ascii_printable,
|
||||
LEN(ascii_printable), &extents);
|
||||
|
||||
f->set = NULL;
|
||||
f->pattern = FcPatternDuplicate(pattern);
|
||||
|
||||
|
@ -3296,7 +3302,7 @@ xloadfont(Font *f, FcPattern *pattern)
|
|||
f->rbearing = f->match->max_advance_width;
|
||||
|
||||
f->height = f->ascent + f->descent;
|
||||
f->width = f->lbearing + f->rbearing;
|
||||
f->width = DIVCEIL(extents.xOff, LEN(ascii_printable));
|
||||
|
||||
return 0;
|
||||
}
|
||||
|
|
Loading…
Reference in New Issue